Optimisation of trench filling in GaN towards vertical HEMT structures
Journal of Crystal Growth(2022)
摘要
•Etched trenches in GaN overgrown with flat layer.•Best overgrowth conditions found by varying pressure, growth rate, V-III ratio and temperature.•Fair electrical results of HEMTs grown on regrown layer.
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关键词
A3: Vapor phase epitaxy,B1: Gallium compounds,B1: Nitrides,B2: Semiconducting III-V materials,B3: High electron mobility transistors,B3: Field effect transistors
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