Analysis of Non-Invasive Fingerprint Thickness Based Authentication Method Utilizing Near Infrared Spectroscopy
Journal of Physics: Conference Series(2022)
摘要
Abstract Fingerprints are a popular method of biometric based authentication. However, methods currently in use are susceptible to being bypass through the use of forgeries of the fingerprint pattern. Measuring the epidermal thickness of the fingerprint is a solution to the issue, as there are no current ways for a third-party to precisely replicate the thickness measurements. Near-Infrared Diffused Reflectance (NIR-DR) spectroscopy is the proposed method of measuring fingerprint thickness. Reflectance reading is taken at 5 specific wavelength points to generate a simplified plot for comparison. Thickness measurement is gauged by calculationg change in reflectance percentage between the 800-900nm range. Data gathered showed variation in the reflectance spectra that was unique to each subject. Application for a fingerprint thickness-based authentication method is plausible but require additional research with a larger population sample and looking into the effects of age and skin colour for their effect on epidermal thickness.
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关键词
near infrared,spectroscopy,non-invasive
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