Time Domain-Based Reflectometry Measurements for 3D Printed Graded Index Dielectrics

Advancements in additive manufacturing approaches and materials have created new possibilities for RF and microwave networks. However, these designs require different approaches to fully characterize the behavior of the network. The use of time domain methods can assist in providing understanding which is typically lost with conventional frequency domain methods. This paper highlights the use of a time domain reflectometry-based technique to analyze the graded index material of a microwave network. The use of the time domain method shows the possibility of extracting the spatially varying relative permittivity.