Analysis of Capacitive Clamp Effect on Power Charging Cords and Plug with EFT Transient Burst Injection

Han-Nien Lin, Tzu-Hao Ho,Wan-Yu Syu,Yu-Ming Wei, Yueh-Hsun Lee,Qain-Yu Ye,Cheng-Hao Huang,Liang-Yang Lin, Yuan-Fu Ku, Jeffrey Yen-Ting Lin

2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)(2022)

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摘要
This paper investigates the coupling effect on EFT Burst transient waveform injected via CDN and capacitive clamp described in IEC 61000-4-4 [1]. We first introduce the EFT Burst transient Generator model [2] previously established published with ANSYS Designer, and which has later been adopted into ANSYS Electronics Desktop serving for immunity effect and protection measure analysis. Even though the EFT generator model has been validated with measured waveform and met pulse specification listed in the Standard, the users of ANSYS Electronics Desktop would further like to simulate their design for immunity performance in combination of EFT generator with capacitive injection clamp as test in EMC laboratory. Therefore we investigate the capacitive coupling effect on EFT waveform which injected onto EUT, for example EV charging cables and plugs, via CDN or clamp with the model of coupling network established by utilization of ANSYS Q3D and SIwave. The coupling model also takes into account the transmission line effectivity for accuracy convergence. This study intends to provide an effective simulation model to help electronic engineers enhancing their EMS design capability.
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关键词
EFT Burst Transient,Capacitive Clamp,Immunity,EV,EMS
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