On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model

Bernhard Bauer, Mouadh Ayache,Saleh Mulhem, Meirav Nitzan,Jyotika Athavale,Rainer Buchty,Mladen Berekovic

Computer（2022）

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摘要

How to understand the dependability concerning electrical/electronic (E/E) product development? We introduce an essential answer that can be perceived as the first step toward a novel approach for dependable E/E product development, called the dual-cone V-model.

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关键词

dependability lifecycle,dual-cone V-model,electrical-electronic product development

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