In-field test solution for enhancing safety in automotive applications

Yehonatan Abotbol, Shahar Dror,Grigor Tshagharyan,Gurgen Harutyunyan,Yervant Zorian

Microelectronics Reliability(2022)

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摘要
Automotive market is evolving rapidly, while boosting and growing semiconductor industry significantly. According to the experts, we are only in the beginning of this exciting new chapter in the evolution – Autonomous Driving. Functional safety and quality requirements for Automotive are taking clearer shape while the industry is progressing for maturity. Therefore, System-on-Chip (SoC) and Intellectual Property (IP) providers must come up with a tailored and adaptive solution, to overcome various challenges. This process is enriching for all parties – SoC providers in incorporating various IPs that addresses different aspects, as well as providing the IP vendors with comprehensive guidelines to enhance their products to adhere these requirements. As a direct consequence to this process, Test and Repair IPs are influenced heavily. This paper presents a full-scale in-field test and repair solution concept for Automotive SoCs which conforms to all safety and quality requirements.
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关键词
In-field test,Automotive,SoC,Mission mode,Built-in self-test
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