Methods for Multi-Layer van der Waals Heterostructures Topological Materials Discovery via STEM and LEEMDavid C. Bell,Cigdem Ozsoy-Keskinbora,Austin Akey,Aravind Devarakonda,Liang Fu,Efthimios Kaxiras,Joseph CheckelskyMicroscopy and Microanalysis(2022)引用 0|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要