Analysis of voltage and frequency-dependent series resistance and interface states of Al/ZnCo2O4: Gelatin/n-Si diode

In this work, which aims to investigate the capacitance and conductance properties of ZnCo2O4-doped Gelatin, 5% ZnCo2O4-doped Gelatin film was grown on n-type silicon wafer by sol–gel spin coating with the aim of fabricating Al/ZnCo2O4:Gelatin/n-Si Schottky diode. This investigation also explores the series resistance $$(R_{S} )$$ and interface state $$(N_{ss} )$$ characteristics of a diode produced with ZnCo2O4:Gelatin interface layer. Electrical measurements were taken in the voltage range of − 5 V and + 2 V and the frequency range of 30 kHz and 1 MHz. The electrical properties of the diodes were characterized from voltage and frequency-dependent measurements. Capacitance–voltage (C-V) and conductance–voltage (G-V) characteristics yielded higher values showing the significance of the interface states. At lower frequencies, the rise in the capacitance value is signed to the interface state density. The values of $$N_{SS}$$ for 30 kHz and 1 MHz frequency are 10.5 × 1011 and 4.19 × 1011 eV−1 cm−2. It is recommended to use the produced diode as an electronic device.