Microscopic modeling of interface roughness scattering and application to the simulation of quantum cascade lasers

Thomas Grange,S. Mukherjee,G. Capellini,M. Montanari,L. Persichetti,L. Di Gaspare,S. Birner,A. Attiaoui,O. Moutanabbir,M. Virgilio,M. De Seta

2022 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)（2022）

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摘要

The theory of interface roughness (IFR) scattering in semiconductor heterostructures is well established in the case of idealized abrupt interfaces [1]. However, in reality, interfaces have a finite width, i.e. interfaces are graded. In such case, the effect of interface roughness, i.e. the breaking of in-plane invariance, a general framework has been lacking to describe the induced scattering processes.

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关键词

microscopic modeling,interface roughness scattering,quantum cascade lasers,semiconductor heterostructures,idealized abrupt interfaces,induced scattering processes

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