Analysis of input receiver transistors behavior during a CDM event

Chloé Troussier,Johan Bourgeat,Emmanuel Simeu,Jean-Daniel Arnould, Blaise Jacquier

2022 44th Annual EOS/ESD Symposium (EOS/ESD)（2022）

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摘要

A comprehensive study of the behavior of input receivers during an ESD CDM event is performed. Several test circuits were made and qualified in CDM. CDM simulations were used to explain the results found. CC-TLP measurements were also performed to increase the accuracy of the results.

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关键词

ESD CDM event,CDM simulations,input receiver transistors behavior,CC-TLP measurements

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