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Highly Robust and Reliable Power Amplifiers in 22FDX and 45RFSOI Technologies.

A. Bossuet,A. Divay,B. Martineau,C. Dehos,B. Blampey, Y. Morandini

ESSDERC 2022 - IEEE 52ND EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC)(2022)

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摘要
This paper reports the VSWR (Voltage Standing Wave Ratio) ruggedness and aging measurements of two power amplifiers designed in 22FDX and 45RFSOI technologies. The PA is one of the most critical function in a front-end module as it is operating at high power and directly impacted by mismatch load. De-rating of 20% is applied on the supply voltage to ensure the operation and durability of the power amplifiers for a 10 years lifetime. The measured and modelled degradation versus time are presented and show excellent results on both technologies.
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关键词
Reliability,Aging,power amplifier,5G,22FDX,45RFSOI
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