PAINEIRA beamline at Sirius: an automated facility for polycrystalline XRD characterization

F R Estrada, D H Barrett, A I Ferreira,J C Mauricio, H Rigamonti Jr, B C Meyer,H C N Tolentino,H Westfahl Jr,C B Rodella

Journal of Physics: Conference Series(2022)

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摘要
Abstract Herein we outline the design of the Paineira beamline – a beamline dedicated to powder X-ray diffraction at the new Brazilian synchrotron source (Sirius). The optical layout optimizes the high photon brightness of the fourth-generation synchrotron light source generated by an undulator. The heavy-duty diffractometer operating in Debye-Scherrer geometry has two detector setups: a multi-analyser crystal for high-resolution and an arc-shaped area detector covering 100° in scattering angle (2θ). The beamline is optimized by carrying out high-throughput measurements with the possibility of rapid setup changes to in-situ and operando measurement conditions. Paineira beamline is under construction and will open new opportunities for materials science, catalysis, energy materials, and geoscience research with synchrotron XRD in Brazil.
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