A Novel Protection Technique for Embedded Memories with Optimized PPA

In today's complex applications, reliability is becoming an increasingly important issue, and one of the most attractive solutions for dealing with in-system failures is error correcting code (ECC). In this paper a novel protection technique is proposed based on an advanced ECC solution that takes into account the level of memory utilization and uses various ECC configurations to optimize power consumption, performance and area. The experimental results demonstrate the effectiveness of the proposed solution.