Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation

Tsutomu Inamoto, Tomoki Nishino,Senling Wang,Yoshinobu Higami,Hiroshi Takahashi

2022 IEEE 11th Global Conference on Consumer Electronics (GCCE)（2022）

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摘要

In this paper, we propose a builtin test pattern generation mechanism that can contain artificial neural networks (ANNs) as the test pattern generator (ANN-TPG). The primary concern of implementing the ANN-TPG is the noise issue. Therefore, we propose a model that considers the noise as the noise layers in ANNs. We also reveal the accuracy of the test pattern generation by the ANN-TPG with considering the noise affection.

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关键词

artificial neural networks,neural networks,test,noise-resilient,on-chip

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