Material Relative Permittivity Determination From the Inhomogeneous Transmission-Line Secondary Parameters.

After further transmission line technique investigation, we propose a new approach to material characterization based on the combination of the propagation constant and the characteristic impedance of the transmission-line. Three main elements constitute the approach novelty's root: the determination of the propagation constant without using the eigenvalue principle, the improved mathematical expression of the characteristic impedance, and the automatically corrected coefficient. The two-line technique is based on three required measures, where the most extended fixture is partially filled with the specimen to be tested. As a result, the discontinuities caused by the geometric change of access interfaces and the waveguide dimensions have been solved. The characteristic impedance is determined straight and amended by a third polynomial function degree. The polynomial function and the amended correction coefficient determination are the facilitation parameters of the new approach technique. This new method allows the extraction of the material's complex relative permittivity. The procedure has been validated with the Rogers RO4003C, Alumina 99.6%, and Vinifera (based on the dielectric materials available in our laboratory) through the microstrip fixture in the scanned frequency (0.08-8) GHz by extracting its electric intrinsic parameters. The dielectric constants range from 1.1-10.4, where the thicknesses are 1.54 mm, 2.067 mm, and 1.078 mm have been used. Two identical microstrip test cells with the same geometric dimensions but various lengths have been manufactured. That promotes the feasibility of two measures simultaneously.