Practical Load Impedance Monitoring System Externally Installed in Plasma Etching Equipment

Yuji Kasashima, Shinji Kuniie, Toshiyuki Sayama,Tatsuo Tabaru

2022 International Symposium on Semiconductor Manufacturing (ISSM)(2022)

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摘要
We have developed the load impedance monitoring method for plasma etching process, which can be externally installed in mass-production equipment. The monitoring system can detect micro-arc discharge and monitor the condition of the film deposited on inner wall of process chamber. In this study, we have upgraded the monitoring system to enhance precision, practicality, and versatility. The system can be used as an effective method for real-time and noninvasive monitoring of plasma etching process.
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关键词
plasma impedance,real-time monitoring,noninvasive monitoring,S-parameter,network analyzer
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