Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique.
Nanoscale(2023)
摘要
A hybrid technique combining atomic force microscopy and the fixed-junction technique is developed to simultaneously probe the electrical and mechanical characteristics of a single-molecule junction.
更多查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要