Correlation between Pancreatic Duct Variation and Related Diseases: An Effective Method Observing the Dual-Energy CT with Low-keV Monoenergetic Images.
Diagnostics (Basel, Switzerland)（2023）
摘要
Pancreatic duct variation is associated with AP, CP, and DPC. Low-keV MEI (+) DECT is an effective method to observe the pancreatic duct system.
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关键词
MRCP,dual-energy CT,pancreas-related diseases,pancreatic duct variation
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