Stress-induced Phase Transformation and Phase Boundary Sliding in Ti:An Atomically Resolved In-Situ Analysis
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY(2023)
摘要
•Stress-induced hcp-to-fcc transformation was captured in real time at the atomic level.•Phase boundary sliding was observed to accommodate the deformation and cracking process.•Phase boundary sliding is mediated by successive glide of extended dislocations.
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关键词
In situ HRTEM,Hcp-to-fcc transformation,Pure Ti,Phase boundary sliding,Molecular dynamics simulation
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