Sample Thickness Measurements Using Phase-Sensitive Terahertz Upconversion Detection

Tobias Pfeiffer,Jens Klier,Georg von Freymann,Daniel Molter

2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022)（2022）

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摘要

We demonstrate our work on phase-sensitive nonlinear upconversion detection of terahertz radiation, using an off-the-shelf sCMOS sensor. The terahertz radiation is upconverted to infrared light using a nonlinear medium and interferes with a second source of coherent light, which yields the phase relation between both sources. Using this approach, six individual single-layer samples were measured in transmission and compared to terahertz time-domain spectroscopy (TDS) measurement results.

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关键词

sample thickness measurements,phase-sensitive terahertz upconversion detection,phase-sensitive nonlinear upconversion detection,terahertz radiation,off-the-shelf sCMOS sensor,infrared light,nonlinear medium,coherent light,phase relation,single-layer samples,terahertz time-domain spectroscopy measurement

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