Investigation of defects in melt and solution grown perovskite CsPbBr3 single crystals

Recently, there has been considerable interest in x-ray and gamma ray detectors with large volume and high energy resolution that operate at room temperature. To improve detector energy resolution, the carrier mobility-lifetime product needs to be increased, and the electronic trap state concentration needs to be minimized. Defect concentrations in the part per billion range can alter the charge transport and carrier recombination lifetime. In this work, thermally stimulated current spectroscopy measurements were systematically carried out in bulk halide perovskite single crystals of CsPbBr3 over a temperature range of 80-320 K. The origins and trap parameters of CsPbBr3 crystals from the solution growth and melt growth procedures were determined and compared. Trap concentrations were ranged from 1 x 10(11) to 1 x 10(16) cm(-3). Appreciable detector performance was observed for CsPbBr3 crystals with trap concentrations less than 1 x 10(14) cm(-3). The comparison of spectral responses of crystal samples grown using two different methods shows that, after purification, solution-grown crystals are comparable to melt-grown crystals in terms of low defect concentration and improved detector performance. For an improved mobility-lifetime product and enhanced spectral response to high energy radiation from fissile materials, trap states in either type of a crystal ingot must be reduced closer to 10(11) cm(-3).