Ternary SRAM circuit designs with CNTFETs

INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS(2023)

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摘要
Static random-access memory (SRAM) is a cornerstone in modern microprocessors architecture, as it has high power consumption, large area, and high complexity. Also, the stability of the data in the SRAM against the noise and the performance under the radian exposure are main concern issues. To overcome these limitations in the quest for higher information density by memory element, the ternary logic system has been investigated, showing promising potential compared with the conventional binary base. Moreover, carbon nanotube field effect transistor (CNTFET) is a new alternative device with proper features like low power consumption and threshold voltage dependency on CNTAQAUTHOR: Please provide the expanded form of CNT at first mention in the abstract and in the body if it is an acronym. diameter. This paper proposes a new design for ternary SRAM using CNTFET and its evaluation by comparing it against two other designs in many aspects. Moreover, we investigated the static noise margin for the three designs to discuss their stability. Furthermore, we studied the reliability of the designs by evaluating the soft errors effect.
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关键词
amplitude-duration criterion,CNTFET,multiple-valued logic (MVL),SEU,SNM,soft errors,SRAM,ternary memory
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