Polymer-based semiconductor wafer cleaning: The roles of organic acid, processing solvent, and polymer hydrophobicity

Seong Hoon Yu, Hayoung Jeon, Hyunki Ko, Ji Hoon Cha, Soyeon Jeon, Mingyu Jae,Geon-Hee Nam,Kyoungsuk Kim, Yeongjin Gil, Kuntack Lee,Dae Sung Chung

Chemical Engineering Journal(2023)

引用 0|浏览4
暂无评分
摘要
•Polymer-based wafer cleaning via flake formation and peeling off phenomenon.•Theoretical simulations according to thermodynamics-based particle removal mechanism.•Analyses of cleaning efficiency according to organic acid, solvent, and substrate.•Effective nanoparticle removal on both low-k and high-k wafers.
更多
查看译文
关键词
Wafer cleaning, Polymers, Nanoparticles, Organic acids, Processing solvent, Flakes
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要