A Design of Waveguide-to-Microstrip Transition for V-band Device Testing
2022 International Conference on Microwave and Millimeter Wave Technology (ICMMT)(2022)
摘要
In this paper, a V-band waveguide-to-microstrip transition based on an antipodal fin-line is presented. A back-to-back transition structure is fabricated and measured. To accomplish the measurement, a metallic body with cavity is manufactured, and it could be used for further test on device like amplifier chip. The printed circuit board (PCB) is easy to be installed in the E-plane of the split-block waveguide. Measured results show that the module provides a return loss better than 14 dB and a low insertion loss across the whole V-band.
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