Defect Generation in Data-Storage Layer by Strong Ion Bombardment for Multi-Level Non-Volatile Memory Applications

Seongmin Park,Taewon Seo, Changmin Jeon, Yong Kyu Lee,Yoonyoung Chung

SSRN Electronic Journal(2022)

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关键词
strong generation bombardment,memory,defect,data-storage,multi-level,non-volatile
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