Combined X-ray diffraction tomography imaging of tension and opposite wood tissues in young hybrid aspen saplings

Combining spatially localized X-ray diffraction (XRD) with X-ray microtomography (XMT) enables the mapping of the micro- and nanoscale structures simultaneously. The combination of these methods results in a powerful tool when considering the structural studies of hierarchical materials, allowing one to couple the relationships and connections of the structures at various scales. In this study, XMT was used to map the anatomy and cellular structures in 3D in tension and opposite wood with 1.5 µm resolution, while XRD was used to determine the cellulose crystallite widths and microfibril orientations with 100 µm spatial resolution within the same tissues. Tension wood (TW) has an important biological function with clearly distinct properties to opposite (OW) and normal wood, e.g. differing cellular structures with a higher cellulose content. This is the first study of very young hybrid aspen saplings (1-month-old) using the combined diffraction tomography method. The TW tissues could be identified from the OW tissues based on both the XMT and XRD results: TW had a higher average size of the cellulose crystallites and smaller mean microfibril angles (mMFA) than those in OW. With the XRD data, we were able to reconstruct the images of the cross sections of the saplings using the structural parameters (cellulose crystallite width and mMFA) as contrast mechanisms. As far as the authors know, there are no previous studies with images on any TW samples using the XRD-based contrast. Home laboratory bench-top set-up offers its advantages for these studies, considering the number of samples characterized, time-dependent studies and larger field of views.