Evolution of the microstructure of superfine grain graphites under thermal oxidation

Athanasia Tzelepi, James McGladdery, I-Hsuan Lo, Glen Copeland

Nuclear Engineering and Design（2023）

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摘要

Fluorescent micrographs of the cross-sections of IG-430 (left), MA (middle) and MB (right) nuclear graphite samples, oxidised at 700 °C, showing the penetration depth of the oxidation:

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关键词

Polarised,Fluorescent,Microscopy,Pycnometry,Image analysis

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