A two-module automated scanning inspection planning methodology for hole features on image measuring instrument

INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY(2023)

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摘要
Quality inspection of the holes is commonly indispensable, as the resulting geometrical errors severely affect the functionality and assembly of the parts. Until now, most machine vision systems have employed a single-camera to obtain the entire contour of an object, but it is of great challenge to ensure high accuracy. This paper proposes a new path-planning strategy in two steps: local path planning (LPP) and global path optimization (GPO). Instead of using a single-camera to acquire the complete contour of a single hole, the moving measurement captures multiple continuous and non-repetitive local contours, improving the resolution of the measured contours. To ensure that the imaging probe avoids interfering with the workpiece during the motion, a dynamic collision detection is used to generate a collision-free path. For multi-hole measurements, a shortest collision-free path algorithm (SCFPA) is proposed to transform the traversal problem of multiple features into a generalized traveling salesman problem (GTSP) and obtain the shortest collision-free path by substituting the collision-free distance into the improved simulated annealing algorithm (ISA). To conduct measurements more accurately and reduce the uncertainty caused by geometric errors, a geometric error model was established, and the nine-line method was utilized to identify error terms. The experimental results show that the proposed measurement method can not only reconstruct the whole 2D hole profile with high-precision but also effectively minimize the inspection path, ensuring the safety of the working process.
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关键词
2D hole contour reconstruction,21 geometric error,Image measuring instrument,GTSP,Simulated annealing
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