Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)

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Journal Article Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection Get access Kevin M Roccapriore, Kevin M Roccapriore Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States Corresponding author: roccapriorkm@ornl.gov Search for other works by this author on: Oxford Academic Google Scholar Maxim Ziatdinov, Maxim Ziatdinov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United StatesComputational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States Search for other works by this author on: Oxford Academic Google Scholar Riccardo Torsi, Riccardo Torsi Materials Science and Engineering, Penn State University, University Park, PA, United States Search for other works by this author on: Oxford Academic Google Scholar Joshua Robinson, Joshua Robinson Materials Science and Engineering, Penn State University, University Park, PA, United States Search for other works by this author on: Oxford Academic Google Scholar Sergei V Kalinin Sergei V Kalinin Department of Materials Science and Engineering, University of Tennessee, Knoxville TN, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 392–393, https://doi.org/10.1093/micmic/ozad067.184 Published: 22 July 2023
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single atomic defects,2d materials,detection,off-axis,real-time,ai-driven
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