Epidote Reference Material Development Calibrated for Oxygen Isotope Determination by Secondary Ion Mass Spectrometry (SIMS).

Claudia I Roig González,Chloë Bonamici,Tyler Blum,William O Nachlas, Mike Spicuzza

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)

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Journal Article Epidote Reference Material Development Calibrated for Oxygen Isotope Determination by Secondary Ion Mass Spectrometry (SIMS) Get access Claudia I Roig González, Claudia I Roig González Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Corresponding author: roig@wisc.edu Search for other works by this author on: Oxford Academic Google Scholar Chloë Bonamici, Chloë Bonamici Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Tyler Blum, Tyler Blum Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar William O Nachlas, William O Nachlas Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Mike Spicuzza Mike Spicuzza Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 221–222, https://doi.org/10.1093/micmic/ozad067.098 Published: 22 July 2023
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关键词
oxygen isotope determination,secondary determination mass spectrometry,mass spectrometry
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