Epidote Reference Material Development Calibrated for Oxygen Isotope Determination by Secondary Ion Mass Spectrometry (SIMS).
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)
摘要
Journal Article Epidote Reference Material Development Calibrated for Oxygen Isotope Determination by Secondary Ion Mass Spectrometry (SIMS) Get access Claudia I Roig González, Claudia I Roig González Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Corresponding author: roig@wisc.edu Search for other works by this author on: Oxford Academic Google Scholar Chloë Bonamici, Chloë Bonamici Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Tyler Blum, Tyler Blum Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar William O Nachlas, William O Nachlas Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Mike Spicuzza Mike Spicuzza Department of Geoscience, University of Wisconsin-Madison, Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 221–222, https://doi.org/10.1093/micmic/ozad067.098 Published: 22 July 2023
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关键词
oxygen isotope determination,secondary determination mass spectrometry,mass spectrometry
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