Mistakes and Pitfalls in in situ TEM Study.

Myung-Geun Han,Yimei Zhu

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada（2023）

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Journal Article Mistakes and Pitfalls in in situ TEM Study Get access Myung-Geun Han, Myung-Geun Han Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA Corresponding author: mghan@bnl.gov Search for other works by this author on: Oxford Academic Google Scholar Yimei Zhu Yimei Zhu Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 422–423, https://doi.org/10.1093/micmic/ozad067.199 Published: 22 July 2023

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tem study,mistakes,situ</i>,pitfalls

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