Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries.

Journal Article Atomic Resolution Mapping of Localized Phonon Modes in Silicon Grain Boundaries Get access Benedikt Haas, Benedikt Haas Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Corresponding author. Email: haas@physik.hu-berlin.de Search for other works by this author on: Oxford Academic Google Scholar Tara M Boland, Tara M Boland School for Engineering of Matter Transport and Energy, Arizona State University, Tempe, AZ, United States Search for other works by this author on: Oxford Academic Google Scholar Christian Elsässer, Christian Elsässer Fraunhofer Institute for Mechanics of Materials IWM, Freiburg, Germany Search for other works by this author on: Oxford Academic Google Scholar Arunima K Singh, Arunima K Singh Department of Physics, Arizona State University, Tempe, AZ, United States Search for other works by this author on: Oxford Academic Google Scholar Katia March, Katia March Sorbonne Université, Muséum National d'Histoire Naturelle, UMR CNRS 7590, Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie, IMPMC, Paris, France Search for other works by this author on: Oxford Academic Google Scholar Juri Barthel, Juri Barthel Ernst Ruska-Centre (ER-C 2), Forschungszentrum Jülich; Jülich, Germany Search for other works by this author on: Oxford Academic Google Scholar Christoph T Koch, Christoph T Koch Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Peter Rez Peter Rez Department of Physics, Arizona State University, Tempe, AZ, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 618–619, https://doi.org/10.1093/micmic/ozad067.300 Published: 22 July 2023