Unveiling Phonon Dispersion Behavior of AlN/GaN Heterostructures Using EELS.
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)
摘要
Journal Article Unveiling Phonon Dispersion Behavior of AlN/GaN Heterostructures Using EELS Get access Joaquin E Reyes-González, Joaquin E Reyes-González Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada Search for other works by this author on: Oxford Academic Google Scholar Niklas Dellby, Niklas Dellby Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Benjamin Plotkin-Swing, Benjamin Plotkin-Swing Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Ping Wang, Ping Wang Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, Michigan, United States Search for other works by this author on: Oxford Academic Google Scholar Ayush Pandey, Ayush Pandey Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, Michigan, United States Search for other works by this author on: Oxford Academic Google Scholar Zetian Mi, Zetian Mi Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, Michigan, United States Search for other works by this author on: Oxford Academic Google Scholar Maureen J Lagos Maureen J Lagos Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, CanadaCanadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario, Canada Corresponding author: mjlagos@mcmaster.ca Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 354–355, https://doi.org/10.1093/micmic/ozad067.165 Published: 22 July 2023
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