Characterization of a Nb-Pb composite target

A thin Nb target on a Pb backing was fabricated using the rolling technique. In the present work, the characterization of the sample has been carried out using various techniques to study the surface morphology, crystallography, elemental analysis, thickness and electrical conductivity useful for the intended use of the target prepared. The thin Nb target was analyzed using scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD) and Rutherford back-scattering spectroscopy (RBS) techniques. The uniform and smooth surface of the sample was confirmed by SEM imaging. The presence of oxygen in the EDS spectra and peaks corresponding to crystal planes of PbO2 in the XRD spectrum confirms the oxidation of Pb foil. The XRD spectrum shows clear peaks corresponding to (011), (002), (112) crystal planes of pure Nb. The thickness of the thin Nb foil measured using the RBS techniques was found to be 0.8 mg/cm(2). The current(I)-voltage(V) curve (relationship between the current flowing through an electronic device and the applied voltage across its terminals) at room temperature for the Pb and Nb/Pb foils was plotted and showed linear relationship between applied voltage and current flowing through the target foil. The measured electrical conductivity indicates an enhancement of 35.9 % for Nb/Pb foil relative to the conductivity measured for the Pb foil.