Study of the structure, structural transition, interface model, and magnetic moments of CrN grown on MgO(001) by molecular beam epitaxy

Structural phase transition is studied in high quality CrN thin films grown by molecular beam epitaxy on MgO(001) substrates. Cross-sectional transmission electron microscopy and x-ray diffraction reveal that the epitaxial relationship between CrN film and MgO substrate is [ 100 ] CrN / [ 100 ]( MgO), [ 110 ] CrN / [ 110 ] (MgO), and [ 001 ] CrN / [ 001 ] MgO. The films show tensile strain/compression at the CrN/MgO(001) interface, which relaxes gradually with the film growth. Temperature dependent x-ray diffraction measurements show a first-order structural phase transition. In addition to the experimental measurements, first-principles theoretical calculations have been carried out for finding a stable model for the CrN/MgO interface. These calculations determine two possible models for the interface, where a monolayer of chromium oxide is formed between the CrN and MgO layers.