Defect Detection in Transparent Materials Based on Optical Coherence Tomography

Xiao Lv, Xiuhao Yao, Jiacheng Lv,Yanjie Zhao,Duo Chen,Hui Li,Jiasheng Ni, Wei Zhang

2023 21st International Conference on Optical Communications and Networks (ICOCN)（2023）

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摘要

High-precision optical components have put forward strict requirements for manufacturing technology, and quality detection technology. In this work optical coherence tomography is used to detect both surface and internal defects in transparent optical materials.

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关键词

Precision surface,Defect detection,Optical coherence tomography

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