Moir\'e plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials

Incommensurate heterostructures of two-dimensional (2D) materials, despite their attractive electronic behaviour, are challenging to simulate because of the absence of translation symmetry. Experimental investigations of these structures often employ scanning tunneling microscopy (STM), however there is to date no comprehensive theory to simulate and predict a STM image in such systems. In this paper, we present a new approach to simulate STM images in arbitrary van der Waals (vdW) heterostructures, using a moir{\'e} plane wave expansion model (MPWEM). Contrary to computationally demanding conventional methods such as density functional theory that in practice require periodic boundaries, our method only relies on the description of the noninteracting STM images of the separate materials, and on a narrow set of intuitive semi-empirical parameters, successfully simulating experimental STM images down to angstrom-scale details. We illustrate and benchmark the model using selected vdW 2D systems composed of structurally and electronically distinct crystals. The MPWEM, generating reliable STM images within seconds, can serve as an initial prediction tool, which can prove to be useful in the investigation of vdW heterostructures, offers an avenue towards fast and reliable prediction methods in the growing field of twistronics.