FIB line marking as a tool for local erosion/deposition/fuzz formation measurements in ASDEX Upgrade during the He campaign

M. Rasinski, S. Brezinsek, A. Kreter, T. Dittmar, K. Krieger, M. Balden,P. de Marne, R. Dux, M. Faitsch, A. Hakola, J. Likonen,E. Tsitrone, V. Rohde

NUCLEAR MATERIALS AND ENERGY(2023)

引用 0|浏览1
暂无评分
摘要
Tungsten (W) is the prime candidate for the plasma facing material in present and future fusion devices. When exposed to a plasma containing He ions, W can exhibit creation of sub-surface nano-bubbles leading to formation of nano-tendrils called fuzz. Formation of W fuzz was confirmed by many laboratory experiments including He loading in linear plasma devices. There is, however, limited experience related to the parameter space for fuzz formation and re-erosion in a tokamak environment. For this reason, a dedicated experiment was carried out in ASDEX Upgrade (AUG) during its 2022 He campaign to study the evolution of fuzz-like W structures.Twelve tungsten samples were mechanically polished to a mirror-like surface finish. Six of them were sub-sequently exposed to a He plasma in the PSI-2 linear device in order to establish a fuzz layer with a thickness of 600 - 800 nm. Before exposure in AUG, all samples were pre-characterized by Focused Ion Beam (FIB) cross-sectioning. In total 48 FIB cross-sections with line markings for quantification of local erosion, deposition and fuzz formation were prepared - 4 on each sample. The samples were placed in two parallel poloidal rows spanning a range of 20 cm around the outer strike line position (OSP). They were subsequently exposed in AUG to a series of 14 consecutive discharges, 8 in H-mode and 6 in L-mode.Detailed analysis by means of electron microscopy revealed on the samples regions of erosion, deposition and fuzz formation. Below the H-mode OSP, homogeneous co-deposits containing W and O, with a thickness up to 400 nm, were found. In the close vicinity of the H-mode OSP, significant erosion of pre-exposure PSI-2 fuzz was observed. The erosion reached up to 100 - 250 nm, depending on the location. In addition, the initially polished samples did not show any newly formed fuzz in that zone. Above the H-mode OSP, new fuzz was formed with a thickness of up to 1 mu m. There was no Mo found in the newly formed fuzz. Pre-exposure PSI-2 fuzz was either removed or modified.
更多
查看译文
关键词
FIB line marking,W fuzz He plasma,ASDEX Upgrade,Microstructure,Erosion and re-deposition
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要