谷歌浏览器插件
订阅小程序
在清言上使用

Accurate Modelling of GaN HEMT Capacitances in the Framework of the ASMHEMT Model

2023 18th European Microwave Integrated Circuits Conference (EuMIC)(2023)

引用 0|浏览2
暂无评分
摘要
Results of pulsed IV, CV and loadpull measurements performed on a GaN HEMT are presented. A model is developed for this device in the framework of the ASM-HEMT model. The developed model utilizes the advantage of measuring beforehand several parameters of the model; hence, reducing the number of parameters to be optimized for a reasonable fit to the measured data. A new approach for modelling the OFF-state capacitances of GaN HEMT is also presented which accounts for the details of the structure of the device, while at the same time maintaining the speed of the model.
更多
查看译文
关键词
compact model,GaN,HEMT,semiconductor device measurement,semiconductor device modeling
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要