Impact of silver nanoparticles embedded in a silica layer on the surface morphology of the structure: Evaluation by Atomic Force Microscopy

This work presents a study on the surface morphology of silica-based dielectric structures, homogeneous or nanocomposite, intended to be electrically connected with external circuitry i.e., to receive electrodes on their surface. The evaluation is performed with Atomic Force Microscopy (AFM) and specific attention is paid to the surface waviness, imposed by the presence of silver nanoparticles (AgNPs) embedded very close to the silica layer surface. Such departure from planarity may strongly modify the designed electric field through local enhancements of the applied field (by a factor of 20 or more) and thus, to alter the device performance.