Topological materials for helicity-dependent THz emission

A. Marman, Y. Saboon, C. Q. Xia, D. A. Damry, P. Schoenherr,D. Prabhakaran,L. M. Herz,T. Hesjedal,M. B. Johnston, J. L. Boland

2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)（2023）

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摘要

Topological insulator (TI) materials are emerging as novel materials for spintronic applications. Here, we demonstrate helicity-dependent THz emission from Dirac semi-metal Cd3As2 nanowires and used scattering-type scanning optical microscopy (s-SNOM) to identify potential single nanowire candidates for device applications. The preliminary investigation data of a candidate nanowire shows a homogenous topography and constant dielectric function in the MIR range. Indicating high-quality crystalline growth ideal for topological characterization.

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关键词

crystalline growth,dielectric function,Dirac semimetal,helicity-dependent THz emission,homogenous topography,nanowire,s-SNOM,scattering-type scanning optical microscopy,topological insulator materials

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