Nanoscale Optical Mode Imaging and Spectroscopy of Dielectric Metasurfaces Based on the Bound State in Continuum

Alex Boehm,Sylvain D. Gennaro,Chloe F. Doiron,Thomas E. Beechem,Michael B. Sinclair,Igal Brener,Raktim Sarma, Taisuke Ohta

2023 Conference on Lasers and Electro-Optics (CLEO)（2023）

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摘要

We use photoemission electron microscopy for hyperspectral imaging of electromagnetic field localization in broken-symmetry III-V semiconductor metasurfaces with high selectivity to characterize complex resonant mode profiles, determine coherent interaction lengths, and corroborate FDTD simulations.

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