Navigating the Transition from R to D: Maximizing the Impact of Basic Research

The transition from basic research to applied research focused on development is a crucial step in the innovation journey. This step is particularly challenging because it requires a significant escalation in commitment while still dealing with the inherent uncertainty of research. The goal of this symposium is to develop a deeper understanding of the challenges involved in early-stage research and spur further interest in understanding the consequences and knock-on effects that decisions at this stage have on the whole innovation process. We present four studies that explore the decisions and processes involved at the interface of research and development and then go on to examine how they impact innovation and technological progress. The four studies provide a rich variety of perspectives showing the range of factors at play at this critical juncture. The studies presented here examine the role of scientific evaluations, organizational division of labor, entrepreneurial knowledge bases and potential market applications in determining the likelihood of research success. Through this symposium we will discuss some of the fundamental contingent factors that determine whether, when and how good ideas make it to market as valuable innovations. Gender Inequality and the Technological Impact of Scientific Ideas Author: Michael A. Bikard; INSEAD Author: Isabel Fernandez-Mateo; London Business School Consequences of R&D Division of Labor for Complementary Innovation: Evidence from Quantum Computing Author: Avi Goldfarb; U. of Toronto, Rotman School of Management Author: Jino Lu; USC Marshall School of Business Author: Florenta Teodoridis; California Southern U. Academic startup and founder knowledge-base proximity and the implications for performance outcomes Author: Justine Boudou; Harvard Business School Author: Maria Roche; Harvard Business School Finding Applications for Nascent Technologies: The Swiss Drone Industry Author: Wouter Beernaert; ETH Zürich Author: Laurens Vandeweghe; ETH Zürich Author: Bart Clarysse; ETH Zürich