Life Prediction of TMR Current Sensor under Accelerated Degradation Test

Sensors are an important component of smart grids. This paper proposes an accelerated degradation test plan for magnetoresistive sensors and establishes a life prediction model based on performance degradation trajectories. Firstly, the structure and working principle of tunneling magnetoresistance (TMR) current sensor are explained, and the performance degradation parameter is selected. Secondly, the Arrhenius model and basic concepts of accelerated degradation testing are introduced. Then, taking a certain model of the TMR current sensor as an example, the experiment is designed and the platform is constructed to obtain the performance degradation trajectory, and thus the life prediction is carried out.