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Power Semiconductor Failure Analysis Tutorial

G. Johnson,Andreas Rummel, Chengbin Huang,Domenico Mello, F. Hitzel,Heiko Stegmann,Hirotoshi Terada, John Byrnes, Sumanta Goswami

Proceedings（2023）

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Abstract
Abstract Presentation slides for the ISTFA 2023 Tutorial session “Power Semiconductor Failure Analysis Tutorial.”
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Key words
failure analysis,semiconductor
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