Detection and Quantification of Extraterrestrial Platinum Group Element Alloy Micronuggets from Archean Impactite Deposits by Low-Voltage Scanning Electron Microscopy/Energy-Dispersive X-ray Spectrometry

Tobias Salge, Tanja Mohr-Westheide

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)

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摘要
Rare, heterogeneously composed platinum group element alloy micronuggets (PGNs) occur in primitive meteorites, micrometeorites, and terrestrial impactite deposits. To gain insight into the nature of these phases, we developed a workflow for the characterization of PGNs using modern scanning electron microscopy (SEM) and energy-dispersive X-ray spectrometry at a low accelerating voltage of 6 kV. Automated feature analysis-a combination of morphological image analysis and elemental analysis with stage control-allowed us to detect PGNs down to 200 nm over a relatively large analysis area of 53 mm(2) with a conventional silicon drift detector (SDD). Hyperspectral imaging with a high-sensitivity, annular SDD can be performed at low beam current (similar to 100 pA) which improves the SEM image resolution and minimizes hydrocarbon contamination. The severe overlapping peaks of the platinum group element L and M line families at 2-3 keV and the Fe and Ni L line families at <1 keV can be resolved by peak deconvolution. Quantitative elemental analysis can be performed at a spatial resolution of <80 nm; however, the results are affected by background subtraction errors for the Fe L line family. Furthermore, the inaccuracy of the matrix correction coefficients may influence standards-based quantification with pure element reference samples.
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关键词
automated feature analysis,electron probe X-ray microanalysis,energy-dispersive X-ray spectrometry,hyperspectral imaging,low-voltage quantification,scanning electron microscopy,spatial resolution
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