Utilizing ECC Analytics to Improve Memory Lifecycle Management.

2023 IEEE International Test Conference (ITC)(2023)

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摘要
With reliability being a critical factor in many applications today, in-system failure detection and correction is a key requirement for ensuring smooth operation in the field. For memory components that occupy the majority of the chip space, this is commonly accomplished with the help of error correcting codes (ECC). However, ECC can offer much more than plain error detection and correction. In particular, the paper describes some of the most common use cases of ECC that help not only to monitor memory health but also to extend its service lifetime by analyzing ECC data over time.
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关键词
analytics,error correcting code,reliability,silicon lifecycle management
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