RRAM Devices for Hardware Integrity and Age Monitoring

NAECON 2023 - IEEE National Aerospace and Electronics Conference（2023）

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摘要

This paper outlines an approach for monitoring the aging and integrity of circuits using Resistive Random Access Memory (RRAM) devices. The intrinsic properties of these devices can be utilized in conjunction with circuitry to translate device changes over time into readout values relating to the age of the circuit under test (CUT).

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关键词

RRAM,Aging,Trust

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