Effect of Sb and Ag Addition and Aging on the Microstructural Evolution, IMC Layer Growth, and Mechanical Properties of Near-Eutectic Sn-Bi Alloys

Hannah N. Fowler, Sukshitha Achar Puttur Lakshminarayana, Sean Yenyu Lai, Sui Xiong Tay, Aleena Masaeng,Ganesh Subbarayan,John E. Blendell,Carol A. Handwerker

Journal of Electronic Materials(2023)

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摘要
Low-melting-point Sn-Bi solder joints (melting point: 139°C) show remarkable resistance to damage accumulation during aggressive thermal cycling. In this study, we used isothermal aging at 85°C of near eutectic Sn-Bi solder joints to determine the effect of Sb in solid solution and Ag3Sn intermetallic on microstructural evolution and the resulting mechanical properties as a way to explain the thermal cycling behavior. Most importantly, the Sb in solid solution in these alloys resulted in higher strength and improved creep resistance when compared to eutectic Sn-Bi. In contrast to Sn-Pb and Sn-Ag-Cu Pb-free alloys, all the near-eutectic Sn-Bi alloys tested showed significant age hardening. In both the unaged and aged conditions, both Sb and Ag additions individually increased the saturation stress of the eutectic Sn-Bi solder joint, but Ag had a more significant effect. However, when both Sb and Ag were added to eutectic Sn-Bi, the saturation stress was lower than when 1 wt.
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Low-temperature solder,lead-free,eutectic Sn-Bi,mechanical testing,aging study
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