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Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors

IEEE transactions on electron devices/IEEE transactions on electron devices(2024)

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摘要
A physics-based analytical dc compact model for single back-gated MoS2 field effect transistors (FETs) is presented. The model is developed by calculating the charge inside the 2-D layer which is expressed in terms of the Lambert W function that recently has become the standard in SPICE simulators. The current is then calculated in terms of the charge densities at the drain and source ends of the channel. A new mobility model is presented to account for the observed superlinear current increase above a certain gate voltage. Despite the simplicity of the model, it shows very good agreement with the experimental data as well as the possibility to be extended to model the double-gate MoS2 FETs.
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关键词
2-D FETs,2-D materials,dc compact model,Lambert W function,MoS(2 )single (back) gate field effect transistor (FET),unified charge control model (UCCM)
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